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About XAFS For Everyone
Product Description XAFS for Everyone provides a practical, thorough guide to x-ray absorption fine-structure (XAFS) spectroscopy for both novices and seasoned practitioners from a range of disciplines. The text is enhanced with more than 200 figures as well as cartoon characters who offer informative commentary on the different approaches used in XAFS spectroscopy. The book covers sample preparation, data reduction, tips and tricks for data collection, fingerprinting, linear combination analysis, principal component analysis, and modeling using theoretical standards. It describes both near-edge (XANES) and extended (EXAFS) applications in detail. Examples throughout the text are drawn from diverse areas, including materials science, environmental science, structural biology, catalysis, nanoscience, chemistry, art, and archaeology. In addition, five case studies from the literature demonstrate the use of XAFS principles and analysis in practice. The text includes derivations and sample calculations to foster a deeper comprehension of the results. Whether you are encountering this technique for the first time or looking to hone your craft, this innovative and engaging book gives you insight on implementing XAFS spectroscopy and interpreting XAFS experiments and results. It helps you understand real-world trade-offs and the reasons behind common rules of thumb. Review "The book is very timely … It is unique in covering theoretical background and experimental details to data analysis in a way that is easy to understand. It will be very valuable to anyone who is interested in using x-ray spectroscopy by helping them to better design and get more out of their experiments."―Dr. Chi-Chang Kao, Director, SLAC National Accelerator Laboratory "The author has found fun and engaging ways to explain details of XAFS that otherwise can seem so dry. I am sure that folks who use my beamline and software will love XAFS for Everyone."―Dr. Bruce Ravel, National Institute of Standards and Technology "A unique presentation with great value for readers and special emphasis on practical aspects … a ‘must have’ for XAFS scientists and beamlines."―Prof. Mark C. Ridgway, Department of Electronic Materials Engineering, Australian National University "This book will be useful to graduate students, post docs, and researchers. I highly recommend it."―Dr. Richard W. Strange, Molecular Biophysics, The University of Liverpool From the Author Long after its discovery in 1920, x-ray absorption fine structure (XAFS) was the domain of physicists, who explored and theorized about the mysterious energy-dependent structures that appeared at energies above the absorption edge in x-ray spectra. In 1971, Dale Sayers, Ed Stern, and Farrel Lytle finally provided a satisfactory description of the physical process which created these features. This description, which incorporated the application of Fourier transforms, provided a readily understood connection to the geometry of the material being measured, immediately suggesting that XAFS could be a powerful tool for characterizing a wide range of materials. A short time thereafter, x-rays from synchrotron light sources began to be used to generate x-ray absorption spectra, dramatically improving the speed and accuracy of data collection. The next two decades featured a rapid development of the theory connecting structure to spectrum. This, along with the rapidly increasing computing power available to the typical scientist, spurred the development and dissemination of software that could aid in the analysis of XAFS. But even with the most powerful software, XAFS is not a black box. The Fourier transform provides an evocative connection to structure, but it does not provide a method by which the structure of a substance can be read directly. The analysis of XAFS is a skill which has to be learned. XAFS is no longer the sole domain of physicists. It is used as a tool in fields as diverse as materials science, synthetic chemis
