X
Thin Film Materials: Stress, Defect Formation and
Thin Film Materials: Stress, Defect Formation and

Thin Film Materials: Stress, Defect Formation and Surface Evolution

Product ID : 39883014
4.3 out of 5 stars


Galleon Product ID 39883014
UPC / ISBN 000521822815
Shipping Weight 3.6 lbs
I think this is wrong?
Model
Manufacturer Cambridge University Press
Shipping Dimension 9.8 x 6.69 x 1.61 inches
I think this is wrong?
-
9,707

*Price and Stocks may change without prior notice
*Packaging of actual item may differ from photo shown
  • Electrical items MAY be 110 volts.
  • 7 Day Return Policy
  • All products are genuine and original
  • Cash On Delivery/Cash Upon Pickup Available

Pay with

About Thin Film Materials: Stress, Defect Formation And

This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films.