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Elementary Scattering Theory: For X-ray and Neutron Users

Product ID : 18959385


Galleon Product ID 18959385
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About Elementary Scattering Theory: For X-ray And Neutron

Product Description The opportunities for doing scattering experiments at synchrotron and neutron facilities have grown rapidly in recent years and are set to continue to do so into the foreseeable future. This text provides a basic understanding of how these techniques enable the structure and dynamics of materials to be studied at the atomic and molecular level. Although mathematics cannot be avoided in a theoretical discussion, the aim has been to write a book that most scientists will still find approachable. To this end, the first two chapters are devoted to providing a tutorial background in the mathematics and physics that are implicitly assumed in other texts. Thereafter, the philosophy has been one of keeping things as simple as possible. Review Review from previous edition: "From length scales, logarithmic and linear, through basic mathematics including the very important complex numbers theory and Fourier series as well as the importance of the phases of waves, the biology and chemistry user of X-ray and/or neutron facilities can turn to this primer to educate themselves in the physics and mathematics behind their chosen techniques. These users' techniques are applied to many sample types, be they:- surfaces or interfaces; liquids or amorphous materials; crystals or powders. The techniques used include scattering (elastic and inelastic; small angle and wide angle; coherent and incoherent) as well as spectroscopy to study molecular structure and dynamics." ―John R Helliwell, University of Manchester "This book offers a fresh approach to scattering theory which emphasises geometric principles over quantum mechanical recipes. It demonstrates how scattering measurements can be understood in a simple and intuitive way via wave interference phenomena. Great care is taken to explain all the necessary mathematics, and the presentation is crystal clear. The book will be particularly useful for individuals using X-ray and neutron scattering to investigate the structure of materials in chemistry, biology, physics, materials science and engineering." ―Andrew Boothroyd, Oxford University About the Author Dr. Sivia studied for his degrees at Cambridge University and then did post-doctoral work at the Los Alamos National Laboratory. He was a staff scientist at the Rutherford Appleton Laboratory, and a College Lecturer at St. Catherine's College, Oxford, for many years before becoming a Fellow of St. John's College, Oxford. In addition to the present text, he has co-authored three books on Mathematics and Physics in the Oxford Chemistry Primers Series, and a book on Bayesian Data Analysis.